Microcrystalline diamond film evaluation by spectroscopic optical coherence tomography

Authors

  • Paulina Strąkowska Faculty of Mechanical Engineering and Ship Technology, Gdańsk University of Technology, Narutowicza 11/12, 80-233 Gdańsk
  • Marcin Robert Strąkowski Faculty of Electronics, Telecommunications and Informatics, Gdańsk University of Technology, Narutowicza 11/12, 80-233 Gdańsk

DOI:

https://doi.org/10.4302/plp.v14i3.1156

Keywords:

Diamond film, OCT, MCD

Abstract

This study has focused on the microcrystalline diamond film (MCD) thickness evaluation. For this purpose, optical coherence tomography (OCT) enhanced by spectroscopic analysis has been used as a method of choice. The average thickness of the tested layer was about 1.5 µm, which is below the standard 2-point OCT resolution. In this case, the usefulness of the spectroscopic analysis was confirmed for the evaluation of the thickness changes in the submicrometer range.

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Published

2022-09-30

How to Cite

[1]
P. Strąkowska and M. R. Strąkowski, “Microcrystalline diamond film evaluation by spectroscopic optical coherence tomography”, Photonics Lett. Pol., vol. 14, no. 3, pp. 50–52, Sep. 2022.

Issue

Vol. 14 No. 3 (2022)

Section

Articles

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