Fabrication and Properties of Erbium-Doped Gallo-Germanate Glass Thin Films via RF-Sputtering

Authors

  • Tomasz Ragiń Bialystok University of Technology
  • Jakub Markiewicz
  • Krzysztof Markowski
  • Karo Sadowska
  • Marcin Kochanowicz
  • Piotr Miluski
  • Jacek Żmojda
  • Jan Dorosz
  • Agata Baranowska
  • Dominik Dorosz
  • Artur Rydosz

DOI:

https://doi.org/10.4302/plp.v17i1.1310

Abstract

This paper presents novel research on amorphous thin films doped with Er3+ ions deposited using the RF-sputtering method. The obtained layers' surface morphology, chemical composition, and optical properties were examined. Scanning electron microscopy analysis revealed a homogeneous layer structure with thicknesses ranging from 160185 nm. Energy-dispersive spectroscopy confirmed the presence of elements such as Ge, Ba, and Ga. Optical properties were measured using photoluminescence spectroscopy, showing emission in the range of 15201550 nm, indicating potential for the integrated optics emission sources.

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References

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Published

2025-03-31

How to Cite

[1]
T. Ragiń, “Fabrication and Properties of Erbium-Doped Gallo-Germanate Glass Thin Films via RF-Sputtering”, Photonics Lett. Pol., vol. 17, no. 1, pp. 1–3, Mar. 2025.

Issue

Vol. 17 No. 1 (2025)

Section

Articles

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Copyright (c) 2025 Photonics Letters of Poland

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