Low loss silica-titania waveguide films

Authors

  • Paweł Karasiński
  • Janusz Jaglarz
  • Jacek Mazur

DOI:

https://doi.org/10.4302/photon.%20lett.%20pl.v2i1.90

Abstract

The paper presents research results on two-component waveguide films SiO2:TiO2 produced in sol-gel technology. The waveguide films were deposited on soda-lime glass substrates using the dip-coating method. For the produced waveguide films, the dispersion characteristics of the refractive index and of the extinction coefficient were determined. The AFM method was used to investigate the typology of waveguide film surfaces. The attenuation of waveguide films was determined using the streak method.

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References:
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Published

2010-03-30

How to Cite

[1]
P. Karasiński, J. Jaglarz, and J. Mazur, “Low loss silica-titania waveguide films”, Photonics Lett. Pol., vol. 2, no. 1, pp. pp. 37–39, Mar. 2010.

Issue

Vol. 2 No. 1 (2010)

Section

Articles

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