Structure of sol-gel derived Nb2O5 films for active coating devices

Authors

  • Barbara Kościelska Gdańsk University of Technology, Faculty of Applied Physics and Mathematics, ul. Narutowicza 11/12, 80-233 Gdańsk
  • Marcin Łapiński Gdańsk University of Technology, Faculty of Applied Physics and Mathematics, ul. Narutowicza 11/12, 80-233 Gdańsk
  • Wojciech Sadowski Gdańsk University of Technology, Faculty of Applied Physics and Mathematics, ul. Narutowicza 11/12, 80-233 Gdańsk
  • Marzena Dęby Gdańsk University of Technology, Faculty of Applied Physics and Mathematics, ul. Narutowicza 11/12, 80-233 Gdańsk

DOI:

https://doi.org/10.4302/photon.%20lett.%20pl.v3i2.214

Abstract

This work presents the results of structure investigations of sol-gel derived Nb2O5 thin films. Traditional therma annealing of as-prepared films leading to Nb2O5 crystalline structure formation [1] was substituted by microwave irradiation. The proposed method allows for covering substrates with a different size and shape. The structure of the films was studied using X–ray diffraction (XRD), atomic force microscopy (AFM) and VIS optical absorption measurements. The films exhibit a quantum size effect. The diameter of nanocrystals depends on microwave radiation power and irradiation time.  

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References:
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Published

2011-06-29

How to Cite

[1]
B. Kościelska, M. Łapiński, W. Sadowski, and M. Dęby, “Structure of sol-gel derived Nb2O5 films for active coating devices”, Photonics Lett. Pol., vol. 3, no. 2, pp. pp. 61–63, Jun. 2011.

Issue

Vol. 3 No. 2 (2011)

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Articles

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