Optical Metrology with many faces

Authors

  • Małgorzata Kujawińska Warsaw University of Technology

DOI:

https://doi.org/10.4302/photon.%20lett.%20pl.v4i2.321

Abstract

A brief editorial overview of the current issue is presented. This special issue of Photonics Letters of Poland devoted to optical metrology contains 15 invited and regularly submitted letters showing a wide range of optical measurement and characterization methods, data processing procedures and their applications.

Author Biography

Małgorzata Kujawińska, Warsaw University of Technology

Faculty of Physics,

Optics Division

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Published

2012-06-30

How to Cite

[1]
M. Kujawińska, “Optical Metrology with many faces”, Photonics Lett. Pol., vol. 4, no. 2, p. pp. 44, Jun. 2012.

Issue

Vol. 4 No. 2 (2012)

Section

Editorial

License

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