Polarization axis fluctuations in a single mode VCSEL laser at 780nm

Authors

  • Grzegorz Dudzik Wroclaw University of Technology
  • Janusz Rzepka Wroclaw University of Technology

DOI:

https://doi.org/10.4302/photon.%20lett.%20pl.v5i3.425

Abstract

We present a transmission method to determine the polarization axis fluctuations for VCSEL (Vertical Cavity Surface Emitting Laser). The research is focused mainly on commercial lasers operatingat 780 nm, designed forlaser spectroscopy. The angle fluctuation of the laser linear axis polarization iselaborated to be less than 150 mrad. Measurement errors of this method are studied and calculated. The measurement uncertainty is ?1,4 mrad andthis is equivalent to ? 5? of arc.Changes of the linear polarization axis depending on the laser current and temperaturearepresented. 

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References
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Published

2013-09-26

How to Cite

[1]
G. Dudzik and J. Rzepka, “Polarization axis fluctuations in a single mode VCSEL laser at 780nm”, Photonics Lett. Pol., vol. 5, no. 3, pp. pp. 94–96, Sep. 2013.

Issue

Vol. 5 No. 3 (2013)

Section

Articles

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