Magneto-optic ellipsometry characterization of Co and SmCo thin films

Authors

  • Volodymyr Tkachenko Intitute of Applied Sciences and intelligent Systems
  • Giancarlo Abbate
  • Antigone Marino

DOI:

https://doi.org/10.4302/plp.v9i1.711

Abstract

Magneto-optic ellipsometry in the longitudinal Kerr configuration was performed to determine the complex permittivity tensor of the Co and SmCo thin films within the spectral range from 400nm to 1000nm. The Co film was a middle layer in a Au/Co/Au trilayer structure. Magneto-optical response was analyzed in terms of Mueller matrix elements. Reduced magneto-optical response of the Co layer is explained by influence of the gold top layer of the trilayer structure.

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Published

2017-03-31

How to Cite

[1]
V. Tkachenko, G. Abbate, and A. Marino, “Magneto-optic ellipsometry characterization of Co and SmCo thin films”, Photonics Lett. Pol., vol. 9, no. 1, pp. pp. 29–31, Mar. 2017.

Issue

Vol. 9 No. 1 (2017)

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Articles

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